全志平台系统启动开关核概率性死机问题分析_全志核心板低温实验 系统卡死

1. 前言

使用全志平台系统开发时，出现概率性死机问题；

这里主要描述下死机分析过程

2. 栈信息

[   27.892505] init: open path: /dev/bus/usb/005/002
[   29.580872] Unable to handle kernel NULL pointer dereference at virtual address 00000004
[   29.589952] pgd = c0004000
[   29.593117] [00000004] *pgd=00000000
[   29.597211] sunxi oops: enable sdcard JTAG interface
[   29.602744] sunxi oops: cpu frequency: 1008 MHz
[   29.602963] sunxi oops: ddr frequency: 576 MHz
[   29.602963] sunxi oops: gpu frequency: 576 MHz
[   29.602963] sunxi oops: cpu temperature: 66
[   29.602963] Internal error: Oops: 5 [#1] PREEMPT SMP ARM
[   29.602963] Modules linked in: 8188eu dummy_acc snd_usb_audio snd_usbmidi_lib snd_hwdep gpio_sunxi sunxi_ir_rx sunxi_sndspdif sndspdif sunxi_spdma sunxi_spdif uvcvideo videobuf_dma_contig videobuf_core mali(O) nand(O) [last unloaded: 8188eu]
[   29.602963] CPU: 0    Tainted: G        W  O  (3.4.39 #1)
[   29.602963] PC is at cpufreq_governor_inter